Raman scattering of ferroelectric lead lanthanum titanate thin films grown on fused quartz by metalorganic chemical vapor deposition
نویسندگان
چکیده
Highly textured lead lanthanum titanate (Pb1−xLax)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300 K and 80 K, showed the features from the PLT film and quartz substrate. By using a “difference Raman” technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed. © 2004 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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